@Misc{refodat_mods_00000051,
  author = 	{Kleiner, Florian},
  title = 	{FIB-SEM nano tomography protocol for high-resolution imaging of cementitous specimens combined with EDX analysis},
  year = 	{2025},
  month = 	{Aug},
  day = 	{27},
  keywords = 	{Rasterelektronenmikroskopie; Tomografie; Zement},
  abstract = 	{This data set contains two tutorial videos that demonstrate how focused ion beam nano tomography can be applied to cementitious samples (here a CEM I) in order to image them with as few artefacts as possible. To do this, a volume (approx. 20 x 20 x 20 {\textmu}m{\textthreesuperior}) is prepared from the bulk material (part 1) and welded to a copper comb (part 2). The second part also shows how to set up image acquisition in `Auto Slice and View' and how to perform EDX data acquisition in `Aztec'. The tutorials were created using a Helios G4 UX scanning electron microscope (Thermo Fischer Scientific) with FIB column and Oxford EDX detectors. The videos are provided as h264-mkv, which can be played by most video players. The videos are also available on YouTube: Part 1: https://youtu.be/d8HOAEcKHvQ Part 2: https://youtu.be/LhByoLyOFiM},
  doi = 	{10.71758/refodat.51},
  url = 	{https://refodat.de/receive/refodat_mods_00000051},
  url = 	{https://doi.org/10.71758/refodat.51},
  file = 	{:https://refodat.de/servlets/MCRZipServlet/refodat_derivate_00000041:TYPE},
  language = 	{de}
}