@Misc{refodat_mods_00000052,
  author = 	{Kleiner, Florian
		and R{\"o}{\ss}ler, Christiane
		and Ludwig, Horst-Michael},
  title = 	{A FIB-SEM Protocol for High-Resolution Imaging Combined with EDX Analysis of Cement-Based Materials with Minimized Damage},
  year = 	{2025},
  month = 	{Sep},
  day = 	{04},
  keywords = 	{Rasterelektronenmikroskopie; Tomografie; Zement; Karlsruhe},
  abstract = 	{This is a recording of a talk held at the Microscopy Conference 2025 in Karlsruhe given on 4 September 2025. It shows how lift-out technique helps to avoid artefacts such as shadowing during the FIB nanotomography process and how post-processing is carried out for such a BSE+EDX data set. This dataset contains a recording as mkv (AVC + MP3 stream) and the presentation slides as PPTX and PDF (both including videos). The video is divided into the following chapters: 00:17 What is FIB nano tomography? 01:16 Well known Artefacts 02:05 Solution: The lift-out process 02:50 Issue 2: Dehydrating specimen 03:21 Damages during EDX data acquisition 03:59 How to solve this issue? 04:58 Post processing 05:47 A brief detour to superpixels 06:49 Summary 07:47 Magic tricks 08:07 Thank you for your attention},
  doi = 	{10.71758/refodat.52},
  url = 	{https://refodat.de/receive/refodat_mods_00000052},
  url = 	{https://doi.org/10.71758/refodat.52},
  file = 	{:https://refodat.de/servlets/MCRZipServlet/refodat_derivate_00000042:TYPE},
  language = 	{de}
}