A FIB-SEM Protocol for High-Resolution Imaging Combined with EDX Analysis of Cement-Based Materials with Minimized Damage

This is a recording of a talk held at the Microscopy Conference 2025 in Karlsruhe given on 4 September 2025.

It shows how lift-out technique helps to avoid artefacts such as shadowing during the FIB nanotomography process and how post-processing is carried out for such a BSE+EDX data set.

This dataset contains a recording as mkv (AVC + MP3 stream) and the presentation slides as PPTX and PDF (both including videos).

The video is divided into the following chapters:
00:17 What is FIB nano tomography?
01:16 Well known Artefacts
02:05 Solution: The lift-out process
02:50 Issue 2: Dehydrating specimen
03:21 Damages during EDX data acquisition
03:59 How to solve this issue?
04:58 Post processing
05:47 A brief detour to superpixels
06:49 Summary
07:47 Magic tricks
08:07 Thank you for your attention