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FIB-SEM nano tomography protocol for high-resolution imaging of cementitous specimens combined with EDX analysis

This data set contains two tutorial videos that demonstrate how focused ion beam nano tomography can be applied to cementitious samples (here a CEM I) in order to image them with as few artefacts as possible. To do this, a volume (approx. 20 x 20 x 20 µm³) is prepared from the bulk material (part 1)…

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