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A FIB-SEM Protocol for High-Resolution Imaging Combined with EDX Analysis of Cement-Based Materials with Minimized Damage
This is a recording of a talk held at the Microscopy Conference 2025 in Karlsruhe given on 4 September 2025. It shows how lift-out technique helps to avoid artefacts such as shadowing during the FIB nanotomography process and how post-processing is carried out for such a BSE+EDX data set. This dataset…